首页> 外文会议>2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology >Rapid-melting-growth of Ge on insulator using Cobalt (Co) induced-crystallized Ge as the seed for lateral growth
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Rapid-melting-growth of Ge on insulator using Cobalt (Co) induced-crystallized Ge as the seed for lateral growth

机译:以钴(Co)诱导结晶的Ge为横向生长的晶种,在绝缘子上Ge的快速熔化生长

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A new type of crystal seed, polycrystalline Ge (poly-Ge) formed by Co induced crystallization was used in the rapid-melting-growth (RMG) of Ge. With the poly-Ge seed, the grain size of Ge films obtained was significantly larger than the one using single crystal epitaxial Si as crystal seed and the one without any crystal seed. High quality (almost single crystal) Ge was obtained on 1 mm × 1 mm square structure and single crystal Ge was obtained on 5 µm wide Ge wires by the RMG method with Co-induced poly-Ge as the crystal seed.
机译:一种新型的晶种,即通过Co诱导结晶形成的多晶Ge(poly-Ge)被用于Ge的快速熔化生长(RMG)中。使用多Ge晶种,获得的Ge膜的晶粒尺寸明显大于使用单晶外延Si作为晶种的Ge膜和没有晶种的Ge膜的晶粒尺寸。通过以Co-诱导的多Ge作为晶种的RMG方法,在1mm×1mm的正方形结构上获得了高质量(几乎单晶)的Ge,在5μm宽的Ge线上获得了单晶Ge。

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