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Micromachined high aspect ratio coplanar waveguide with high impedance and low loss on low resistivity silicon

机译:在低电阻率硅上具有高阻抗和低损耗的微加工高纵横比共面波导

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A micromachining process has been developed to create high impedance and low loss high aspect ratio coplanar waveguide (HARC) on low resistivity silicon. The process uses silicon DRIE to create an array of tall mesas that are spaced with a precise pitch. The silicon mesa array is then merged into a single solid SiO2 mesa using thermal oxidation. The solid SiO2 mesa creates a wide dielectric for use in high impedance HARC. The complete fabrication process includes DRIE, thermal oxidation, electroplating, planarization, and substrate removal to create HARC on low resistivity silicon with a planar surface. A high impedance HARC has been fabricated on silicon using this method. Measurements show that silicon substrate removal increases the line impedance from ∼ 20 Ohms to 57 Ohms, reduces effective dielectric constant from ∼ 6 to 2, and reduces attenuation constant from ∼ 33 dB/cm to 4 dB/cm @ 30 GHz. Measurements are compared to an analytical model derived for HARC.
机译:已经开发出一种微加工工艺,以在低电阻率的硅上创建高阻抗,低损耗,高纵横比的共面波导(HARC)。该工艺使用硅DRIE创建高台面阵列,并以精确的间距隔开。然后使用热氧化将硅台面阵列合并为单个固体SiO2台面。固体SiO2台面产生了一种高电介质,可用于高阻抗HARC。完整的制造过程包括DRIE,热氧化,电镀,平坦化和衬底去除,以在具有平坦表面的低电阻率硅上创建HARC。使用这种方法已经在硅上制造了高阻抗HARC。测量结果表明,在30 GHz频率下,去除硅衬底会使线路阻抗从20欧姆增加到57欧姆,有效介电常数从6减少到2,衰减常数从33 dB / cm减少到4 dB / cm。将测量结果与针对HARC得出的分析模型进行比较。

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