Optical reflectometry and ellipsometry measurements of graphene and thin graphitic films on bulk low-index substrates

摘要

Optical reflectometry and ellipsometry measurements are taken on graphene layers on a variety of bulk substrates using visible light sources. Using a universal optical conductance model allows accurate determination of layer number. Extension of reflectometry to ellipsometry has the potential to probe anisotropy in optical conductance, and is expected to be useful for graphene sample and device characterization for transparent graphene electrode technology.