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Optical and electrical properties of Ga-doped ZnO nanorod arrays fabricated by catalyst-free thermal evaporation

机译:无催化剂热蒸发制备Ga掺杂ZnO纳米棒阵列的光电性能

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Ga-doped ZnO nanorod arrays with different Ga dopant content (Ga/Zn varied from 0 to 0.8 in the source mixtures) were fabricated by catalyst-free thermal evaporation on p-silicon substrate. The morphology, structure, optical and electrical properties were investigated. The results show that well-aligned array morphologies of single crystalline wurtzite ZnO nanorod with different Ga content are grown preferentially in the c-axis direction. Room-temperature photoluminescence (PL) spectrum of the arrays exhibited unique strong and sharp UV emission band at 380 nm. It reveals a low concentration of oxygen vacancies in the ZnO nanorods and their high optical quality. A p-n diode structure with Ga-doped ZnO nanorods grown on p-Si displayed excellent rectifying behaviors by the I-V characteristics. The conductivity can be largely improved when Ga content (Ga/Zn atom ratio) varied from 0.1 to 0.2 and reached a best electrical property when Ga/Zn is 0.5.
机译:通过无催化剂热蒸发在p硅衬底上制备了具有不同Ga掺杂剂含量的Ga掺杂ZnO纳米棒阵列(Ga / Zn在源混合物中为0到0.8)。研究了形貌,结构,光学和电学性质。结果表明,具有不同Ga含量的单晶纤锌矿型ZnO纳米棒的排列良好的阵列形貌优先沿c轴方向生长。阵列的室温光致发光(PL)光谱在380 nm处显示出独特的强而锐利的UV发射带。它揭示了ZnO纳米棒中氧空位的浓度低以及它们的高光学质量。通过I-V特性,具有在p-Si上生长的Ga掺杂的ZnO纳米棒的p-n二极管结构表现出出色的整流性能。当Ga含量(Ga / Zn原子比)从0.1变化到0.2时,可以大大提高导电率,而当Ga / Zn为0.5时,可以达到最佳的电性能。

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