31-piezoelectric micromechanical resonator have been demonstrated for the first time using '/> Q-boosted AlN array-composite resonator with Q>10,000
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Q-boosted AlN array-composite resonator with Q>10,000

机译:Q> 10,000的Q增强AlN阵列复合谐振器

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Quality factors (Q''s) greater than 10,000 and higher than reported for any other sputtered AlN d31-piezoelectric micromechanical resonator have been demonstrated for the first time using an energy sharing mechanical circuit that mechanically couples two electrode-equipped AlN resonators with several electrode-less ones. The key enablers behind the described Q increase are 1) removal of metal electrodes from the inner AlN resonators to remove metal-to-piezoelectric interface losses towards a more than 8× increase in Q; and 2) coupling these higher Q electrode-less resonators to electrode-equipped ones to share energy between the resonators in a way that effectively boosts the Q of the latter with very little increase in motional impedance. By attaining such high Q, this work now proves that the Q of previous AlN resonators was not limited by material inadequacies, and that in fact metal is most responsible for suppressing the Q of previous AlN piezoelectric thin-film devices. The much higher Q''s demonstrated here should greatly decrease both insertion loss in filters and phase noise in oscillators.
机译:首次使用能量共享机械电路将两个原子耦合的AlN d 31 -压电微机械谐振器进行了首次演示,证明其品质因数(Q)大于10,000,并且高于报告的任何其他数值。带电极的AlN谐振器,带有几个无电极谐振器。所述Q增加背后的关键因素是:1)从内部AlN谐振器中去除金属电极,以去除金属与压电界面的损耗,使Q值增加8倍以上; 2)将这些较高Q值的无电极谐振器耦合到配备电极的谐振器,以在不增加运动阻抗的情况下有效提高后者的Q的方式共享谐振器之间的能量。通过获得如此高的Q,这项工作现在证明了以前的AlN谐振器的Q不受材料不足的限制,并且实际上,金属是抑制以前的AlN压电薄膜器件的Q的主要原因。此处显示的更高的Q值将大大降低滤波器的插入损耗和振荡器的相位噪声。

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