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Noise driven in-package decoupling capacitor optimization for power integrity

机译:噪声驱动的封装内去耦电容器优化,以实现电源完整性

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The existing decoupling capacitance optimization approaches meet constraints on input impedance for package. In this paper, we show that using impedance as constraints leads to large overdesign and then develop a noise driven optimization algorithm for decoupling capacitors in packages for power integrity. Our algorithm uses the simulated annealing algorithm to minimize the total cost of decoupling capacitors under the constraints of a worst case noise. The key enabler for efficient optimization is an incremental worst-case noise computation based on FFT over incremental impedance matrix evaluation. Compared to the existing impedance based approaches, our algorithm reduces the decoupling capacitor cost by 3x and is also more than 10x faster even with explicit noise computation.
机译:现有的去耦电容优化方法满足了封装输入阻抗的约束。在本文中,我们证明了使用阻抗作为约束条件会导致较大的过度设计,然后开发了一种噪声驱动的优化算法,以使封装中的电容器去耦以实现电源完整性。在最坏情况下,我们的算法使用模拟退火算法来最小化去耦电容器的总成本。有效优化的关键因素是基于FFT的增量最坏情况噪声计算,而不是基于增量阻抗矩阵评估。与现有的基于阻抗的方法相比,我们的算法将去耦电容器的成本降低了3倍,并且即使进行了显式的噪声计算,其速度也快了10倍以上。

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