power HEMT; millimetre wave field effect transistors; aluminium compounds; gallium compounds; III-V semiconductors; wide band gap semiconductors; semiconductor device testing; current density; electric resistance; access resistance; rf performance; mm-wave AlGaN/GaN HEMT; GaN-based power transistors; Monte Carlo simulations; pinch-off; saturation frequency; maximum frequency performance; parasitic resistances; channel current density; differential access resistance; AlGaN-GaN;
机译:通过低温测量研究存取电阻对AlGaN / GaN HEMT高频性能的影响
机译:动态访问电阻对AlGaN / GaN HEMT的g {sub} m和f {sub} T线性的影响
机译:AlGaN和InGaN背势垒对AlGaN / GaN HEMT性能的影响
机译:MM-Wave AlGaN / GaN HEMTS对射频性能的影响
机译:机械应力对AlGaN / GaN HEMT性能的影响:沟道电阻和栅极电流。
机译:基于PD-Algan / GaN HEMTS栅极偏压调制的二氧化氮气体传感器性能优化
机译:栅极漏电流对alGaN / GaN HEmT的影响由低频噪声和脉冲电测量证明,栅极漏电流对alGaN / GaN HEmT的影响由脉冲I-V和低频噪声测量证明
机译:si,GaN和alGaN / GaN高电子迁移率晶体管(HEmT)晶片的非接触迁移率,载流子密度和薄层电阻测量。