首页> 外文会议>High Performance Devices, 2002. Proceedings. IEEE Lester Eastman Conference on >Channel recessed 4H-SiC MESFETs with F/sub t/ of 14.5GHz and F/sub max/ of 40GHz
【24h】

Channel recessed 4H-SiC MESFETs with F/sub t/ of 14.5GHz and F/sub max/ of 40GHz

机译:通道凹陷的4H-SiC MESFET,F / sub t /为14.5GHz,F / sub max /为40GHz

获取原文

摘要

Channel recessed 4H-SiC MESFETs have demonstrated excellent small signal characteristics and the effect of Si/sub 3/N/sub 4/ passivation on these devices has been studied in this work. A saturated current of 250-270 mA/mm and a maximum transconductance of 40-45 mS/mm were measured for these devices. The 3-terminal breakdown voltage V/sub ds/ ranges from 120 V to more than 150 V, depending on gate-drain spacing. 2/spl times/200 /spl mu/m devices with 0.45 /spl mu/m gate length show high F/sub t/ of 14.5 GHz and F/sub max/ of 40 GHz. After Si/sub 3/N/sub 4/ passivation, the output power and PAE were increased by 40% and 16%, respectively, for CW power measurement. Other measurements, such as, the change in surface potential and the dispersion of the drain current make it clear that the passivation of SiC MESFETs reduces the surface effects and enhances the RF power performance by suppressing the instability in DC characteristics.
机译:沟道凹入4H-SiC MESFET已显示出优异的小信号特性,并且在这项工作中研究了Si / sub 3 / N / sub 4 /钝化对这些器件的影响。这些设备的饱和电流为250-270 mA / mm,最大跨导为40-45 mS / mm。 3端子击穿电压V / sub ds /的范围为120 V至150 V以上,具体取决于栅漏间距。闸门长度为0.45 / spl mu / m的2 / spl次/ 200 / spl mu / m器件显示出14.5 GHz的高F / sub t /和40 GHz的F / sub max /。经过Si / sub 3 / N / sub 4 /钝化后,用于CW功率测量的输出功率和PAE分别增加了40%和16%。其他测量,例如表面电势的变化和漏极电流的分散,清楚地表明,SiC MESFET的钝化可通过抑制DC特性的不稳定性来降低表面效应并增强RF功率性能。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号