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Requirements for Lithography and Mask Technology from the Standpoint of the System LSI Business

机译:从系统LSI业务的角度对光刻和掩模技术的要求

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The SLI business embraces inherent problems in relationt o silicon proces and design implementation. As the technology becomes more complex and geometries become smaller, shortening TAT and reducing costs become vever more urgent and significant tasks. Efforts are currently being made, particularly in the field of compilable total solutions, to shorten TAT and to re-use modules so as to reduce costs. in the trend towards smaller geometries, TAT and costs related to the mask process (including MDP) are becoming significant factors. It is necessary to optimize the entire process from design to MDP (including OPC and PSM), mask-making and lithography and thereby improve pattern precision, reduce EB writer shots, achieve greater mask latitude and identify true defects. It will also be necessary to re-use the lithography model during MDP and to use a consistent data hierarchy and a consistent data format.
机译:SLI业务包含与硅工艺和设计实现有关的固有问题。随着技术变得越来越复杂且几何尺寸越来越小,缩短TAT并降低成本变得更加紧迫而重要。当前正在努力,特别是在可编译的整体解决方案领域中,以缩短TAT和重新使用模块以降低成本。在几何尺寸趋于减小的趋势中,与掩模工艺(包括MDP)相关的TAT和成本正成为重要因素。有必要优化从设计到MDP(包括OPC和PSM),掩膜制作和光刻的整个过程,从而提高图案精度,减少EB写入次数,实现更大的掩膜纬度并识别出真正的缺陷。在MDP期间也有必要重新使用光刻模型,并使用一致的数据层次结构和一致的数据格式。

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