Latent ESD failures in schottky barroer diodes

摘要

This paper describes a case study of microwave transceivers that were losing their sensitivity within a few months of operation due to the ESD latent failure of the Schottky barrier diodes. The culprit was a pick & place machine used to bin the diodes after the DC & RF characterization tests. It was degrading the diodes by subjecting them to ESD (CDM) pulses.