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Terahertz emission spectroscopy of coherent phonons in semiconductors

机译:半导体中相干声子的太赫兹发射光谱

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Abstract: We investigate infrared-active coherent phonons excited in Te, PbTe (un-doped, n-type and p-type), and CdTe by observing the terahertz (THz) emission from these samples. Coherent THz emission corresponding to the longitudinal- optical (LO)-phonon frequency has been observed for all the samples, while no significant THz emission is observed at the transverse-optical (TO)-phonon frequency even at high carrier densities ($GRT 10$+18$/ cm$+$MIN@3$/). The absence of THz emission at the TO-phonon frequency strongly contradicts the observation in the transient reflectivity measurements, where the signal oscillations at the TO-phonon frequencies arising from the LO-phonon-plasmon coupling (L_ mode) have been observed at high carrier densities. It is found from a model calculation that for a dipole oscillator on a sample surface the THz emission around the TO-phonon frequency is strongly suppressed due to the large dielectric constant near this frequency.!19
机译:摘要:通过观察来自这些样品的太赫兹(THz)发射,调查TE,PBTE(不掺杂,N型和P型)和CDTE中激发的红外活动相干声子。对应于纵向光学(LO) - 本频率的相干THz发射对所有样品已经观察到,而即使在高载波密度下,也没有在横向光学(TO)频率上观察到显着的THz排放($ GRT 10 $ + 18 $ / cm $ + $ min @ 3 $ /)。在往文频频率的情况下,在瞬态反射率测量中没有强烈地矛盾,其中在高载波中已经观察到由LO-Phonon-耦合耦合(L_模式)产生的到声子频率的信号振荡密度。从模型计算中发现,由于该频率附近的介电常数大,对于样品表面上的偶极振荡器对样品表面上的THz发射被强烈抑制。!19

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