首页> 外文会议>Indium Phosphide and Related Materials, 1998 International Conference on >Abnormal Zn diffusion along slip dislocation of InP/InGaAs/InP PIN photodiode
【24h】

Abnormal Zn diffusion along slip dislocation of InP/InGaAs/InP PIN photodiode

机译:Zn沿着InP / InGaAs / InP PIN光电二极管的滑脱位错扩散

获取原文

摘要

Crystal quality and dark current characteristics for InP/InGaAs/InP PIN Photodiode along slip dislocation of sulfur-doped InP substrate have been studied. We found for the first time that Zn is abnormally diffused on the surface of PIN-PD along slip dislocations in InP(S) substrate, which means that the PIN structure in the chip is partially destroyed.
机译:研究了InP / InGaAs / InP PIN光电二极管沿掺硫InP衬底的滑动错位的晶体质量和暗电流特性。我们首次发现Zn在PIN-PD的表面上沿着InP(S)衬底中的滑脱位错异常扩散,这意味着芯片中的PIN结构被部分破坏。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号