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Underfill encapsulant technology for flip chip assembly

机译:用于倒装芯片组装的底部填充密封剂技术

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Direct chip attach (DCA) flip chip assembly offers many advantagesin terms of signal speed and performance, compactness, weight and longterm cost savings. The growth of portable electronics has focusedattention on the use of flip chip attach, where all of these virtues areattractive. Selection of uniquely compatible materials for advancedassembly and packaging is rarely possible and a compromise is nearlyalways needed. This is particularly the case with DCA of complex Sidevices using bumped technology for interconnection and mechanicalattachment to the substrate. While there is considerable interest in theuse of specialised conductive polymer adhesives, the implementation ofDCA mainly relies on metallurgical connection between chip and substratepad, whether it be the C4 solder bump process or the recent Au studtechnique. The inevitable CTE mismatch between chip and compositesubstrate must be managed for long term joint reliability. Early work inDCA/flip chip development has shown clearly the possibility of jointdislocation and failure when the device is thermally stressed,particularly under extended rapid temperature cycling. Polymer-basedunderfill encapsulant materials have been developed and formulated tominimise the effect of ΔCTE induced stresses which manage theproblem effectively by acting as a mechanical compensator layer betweenchip and substrate. This paper outlines the basic requirements of theunderfill material, the effects of CTE mismatch and methods ofapplication. An overview of typical problems with flip chip/underfillencapsulants is also presented
机译:直接芯片连接(DCA)倒装芯片组装具有许多优势 在信号速度和性能,紧凑性,重量和耐用性方面 节省长期费用。便携式电子产品的增长集中在 注意使用倒装芯片连接,所有这些优点都是 吸引人的。选择独特兼容的材料进行高级加工 几乎不可能进行组装和包装,并且几乎是折衷方案 总是需要的。对于复杂Si的DCA尤其如此 使用凹凸技术进行互连和机械化的设备 附着到基板上。尽管人们对 使用专门的导电聚合物胶粘剂,执行 DCA主要依靠芯片和基板之间的冶金连接 垫,无论是C4焊料凸点工艺还是最近的Au螺柱 技术。芯片与复合材料之间不可避免的CTE不匹配 必须对基材进行长期的联合可靠性管理。早期工作于 DCA /倒装芯片的开发清楚地表明了联合的可能性 当设备受到热应力时会发生脱位和故障, 特别是在延长的快速温度循环下。聚合物基 已开发并配制了底部填充密封剂材料,以用于 最小化ΔCTE引起的应力的影响,该应力可控制 通过充当之间的机械补偿层有效地解决了问题 芯片和基板。本文概述了基本要求 底部填充材料,CTE失配的影响和方法 应用。倒装芯片/底部填充的典型问题概述 还介绍了密封剂

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