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Redundant states in test control block design

机译:测试控制块设计中的冗余状态

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The number of states in sequential circuit designs does not usually equal to 2/sup n/ This results in a number of redundant state codes. It has been accepted that redundant state codes are used as don't cares in the next-state equations. The target is a reduction of the hardware costs. In doing so the behaviour of the circuit in redundant states has not been specified in advance. Error handling and testability may be a serious problem. This paper shows there is an alternative. Redundant states can be fully specified in a simple and meaningful way, often with even better hardware efficiency than a state assignment with don't cares. Some additional results in encoding test control blocks are also given.
机译:顺序电路设计中的状态数通常不等于2 / sup n /。这导致了许多冗余状态码。已经接受的是,在下一个状态方程式中,不需要使用冗余状态码。目标是降低硬件成本。在这种情况下,尚未预先指定电路在冗余状态下的行为。错误处理和可测试性可能是一个严重的问题。本文显示了另一种选择。冗余状态可以用一种简单而有意义的方式进行完全指定,通常,其硬件效率要比无所谓的状态分配要好。还给出了编码测试控制块的一些其他结果。

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