首页> 外文会议>Electromagnetic Compatibility, 1993. Symposium Record., 1993 IEEE International Symposium on >Disturbances induced in interconnecting microstrip lines excited in the near-field of an electric dipole
【24h】

Disturbances induced in interconnecting microstrip lines excited in the near-field of an electric dipole

机译:在电偶极子的近场中激发的互连微带线中引起的干扰

获取原文

摘要

A full-wave model based on the electric dyadic Green's function has been used to analyze the response of a microstrip line excited in the near field of an electrically short dipolar source. Using the moment method, the surface current excited on the strip has been computed. It has been found that considerable effects are produced by the interaction of the microstrip line with the near-field source's components. The current induced along a microstrip line as well as at its loads has been evaluated for different positions and polarizations of the dipolar source. The numerical results indicate that only a full-wave model which takes into account both the surface and volume waves excited in the structure can be used to evaluate the influence of the electric and geometric parameters, and/or to determine the position of other passive and/or active components that reduces the induced disturbances.
机译:基于电动二极管函数的全波模型已经用于分析在电短偶极源的近场中激发的微带线的响应。使用矩方法,已经计算了在条带上激励的表面电流。已经发现,通过微带线与近场源部件的相互作用产生了相当大的效果。已经评估了沿微带线和载荷引起的电流,用于不同的偶极源的不同位置和偏振。数值结果表明,仅考虑在结构中激发的表面和体积波的全波模型可用于评估电气和几何参数的影响,和/或确定其他被动和其他被动的位置/或减少诱导干扰的活性组件。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号