首页> 外文会议>Indium Phosphide and Related Materials, 1991., Third International Conference. >Laser properties of 1.35 mu m InGaAs/InGaAsP-separate-confinement-multi-quantum-well-structures
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Laser properties of 1.35 mu m InGaAs/InGaAsP-separate-confinement-multi-quantum-well-structures

机译:1.35μmInGaAs / InGaAsP分离约束多量子阱结构的激光特性

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Measurements of the threshold current densities of 1.35 mu m InGaAs/InGaAsP MQW separate-confinement laser structures are presented. It is shown that the lowest values for the threshold current density can be obtained with barrier thicknesses between 10 and 15 nm. The extrapolated threshold current densities of the investigated structures varied between 780 and 1120 A-cm/sup -2/. depending on the number of wells. The characteristic temperature T/sub 0/ of the laser structures was about 60 K.
机译:提出了1.35μmInGaAs / InGaAsP MQW分离约束激光结构的阈值电流密度的测量方法。结果表明,势垒电流密度的最低值可以在10到15 nm的势垒厚度下获得。研究结构的外推阈值电流密度在780和1120 A-cm / sup -2 /之间变化。取决于孔的数量。激光结构的特征温度T / sub 0 /约为60K。

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