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High purity InP grown by chemical beam epitaxy

机译:化学束外延生长的高纯度InP

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Optical and transport properties of InP layers that demonstrate that when growth conditions are carefully optimized, the purity of chemical beam epitaxy (CBE)-grown InP is very high are discussed. The optical properties of the grown material are analyzed the bandgap temperature dependence of InP is determined. A Hall mobility as high as 153800 cm/sup 2/ V/sup -1/ s/sup -1/ at 77 K with N/sub d/-N/sub a/=1.5*10/sup 14/ cm/sup -3/ has been obtained by adjusting the substrate and the phosphine cracker temperatures. The 2 K photoluminescence spectra show finely resolved excitonic transitions for layers grown above 535 degrees C with linewidths as narrow as 0.07 meV. Excitonic transitions have been recorded between 2 K and 250 K. The free exciton energy position leads to a highly accurate expression of the bandgap energy, which extrapolates to E/sub g/=1.347 eV at 300 K.
机译:InP层的光学和传输特性表明,当仔细优化生长条件时,讨论的化学束外延(CBE)生长的InP的纯度非常高。分析了生长材料的光学特性,确定了InP的带隙温度依赖性。在77 K时,N / sub d / -N / sub a / = 1.5 * 10 / sup 14 / cm / sup时,霍尔迁移率高达153800 cm / sup 2 / V / sup -1 / s / sup -1 /通过调节底物和膦裂化器温度获得了-3 /。 2 K光致发光光谱显示了在535摄氏度以上生长且线宽窄至0.07 meV的层的精细解析的激子跃迁。激子跃迁已记录在2 K和250 K之间。自由激子能量位置导致带隙能的高精度表达,其在300 K时外推至E / sub g / = 1.347 eV。

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