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Calculation of voltage drops in the vias of a multichip package

机译:计算多芯片封装的过孔中的压降

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A methodology for calculation of the voltage drops in the vias of a multichip package is presented. The vias are treated as lumped-circuit elements, and the excess capacitance and inductance of the vias are not considered. Numerical techniques were employed to determine the voltage and current waveforms of the signal path between two chips. After the current waveforms for the vias were determined, the voltage drop in ground was obtained by multiplying the current by the internal partial impedance. It was found that the peak noise is very small (in the range of 0.0005 V for a parallel-terminated line) for an input of 1 V due to the utilization of multiple power and ground vias in the design considered. it is point out that the location of the vias (relative to the drivers) has to be carefully chosen when the peak voltage drops are to be minimized.
机译:提出了一种用于计算多芯片封装的过孔中的压降的方法。将过孔视为集总电路元件,并且不考虑过孔的过大电容和电感。采用数值技术确定两个芯片之间信号路径的电压和电流波形。确定通孔的电流波形后,通过将电流乘以内部部分阻抗即可获得接地电压降。结果发现,由于在设计中考虑了多个电源和接地过孔的使用,因此对于1 V的输入,峰值噪声非常小(对于平行端接的线,该噪声在0.0005 V的范围内)。要指出的是,当要使峰值电压降最小时,必须仔细选择过孔的位置(相对于驱动器)。

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