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A Novel Warpage Reinforcement Architecture with RDL Interposer for Heterogeneous Integrated Packages

机译:用于异类集成封装的带有RDL插入器的新型翘曲加固架构

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Over the past two decades, the multi-functions of portable electronic devices have a significant influence to change the daily life of people. To meet the requirements of short transmission path of signals, and high I/O counts, ultrathin packaging technology and novel packaging architectures are continuously progressed in accordance with the emergence of advanced technologies in global semiconductor industry. Currently, the architecture of fan out panel-level packaging (FOPLP) grows into the mainstream to meet the essentials of three-dimensional chip stacking and heterogeneous integration. Some researches suggested that the fine metal trace small than 5μm/5μm (line-width/spacing) has been carried out by using redistributed layer (RDL) first interposer technology. In the meanwhile, the package on package framework was introduced for connecting application processor and stacked memory chips, which have been gradually implemented the above-mentioned portable electronic devices. However, the warpage issue of the top and bottom packages are always a critical issue while assembled. In order to solve this issue, an additional reinforcement frame, integrated with RDL interposer is proposed to reduce its deformation caused by coefficient of thermal expansion (CTE) mismatch among the materials of packaging components. The design of reinforcement frame is 15 mm x 15 mm with a 12 mm x 12 mm cavity. There are 540 interconnections with a 300 gm of pitch at the periphery of the present package. To estimate the reliability of abovementioned novel package with efficiency, a non-linear process-oriented finite element analysis (FEA) is approached. In addition, the technique of equivalent material characteristics is also needed into FEA model to simplify the complexity of packaging structure. Finally, the better combinations to control the warpage of the present novel packaging structure through choosing the type of MUF. The warpage of packaging is obtained via the simulation methodology and provided as the designed guideline of related packaging architectures.
机译:在过去的二十年中,便携式电子设备的多功能性对改变人们的日常生活产生了重大影响。为了满足短信号传输路径和高I / O数量的要求,随着全球半导体行业中先进技术的出现,超薄封装技术和新颖的封装架构不断发展。当前,扇出面板级封装(FOPLP)的体系结构已成为主流,以满足3D芯片堆叠和异构集成的基本要求。一些研究表明,使用重分布层(RDL)第一中介层技术已经完成了小于5μm/5μm(线宽/间距)的细金属痕迹。同时,引入了封装上的封装框架以连接应用处理器和堆叠的存储芯片,它们已经逐渐实现了上述便携式电子设备。但是,顶部和底部包装的翘曲问题始终是组装时的关键问题。为了解决这个问题,提出了一种与RDL中介层集成的附加加固框架,以减少由于包装组件材料之间的热膨胀系数(CTE)不匹配而引起的变形。加固框架的设计为15毫米x 15毫米,内腔为12毫米x 12毫米。在本封装的外围有540个互连,节距为300 gm。为了有效地评估上述新型包装的可靠性,提出了一种面向非线性过程的有限元分析(FEA)。此外,在FEA模型中还需要使用等效材料特性的技术,以简化包装结构的复杂性。最后,通过选择MUF的类型,更好的组合来控制当前新颖包装结构的翘曲。包装的翘曲是通过模拟方法获得的,并作为相关包装体系结构的设计指南提供。

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