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A Novel Scheme for Concurrent Error Detection of OLS Parallel Decoders

机译:一种用于OLS并行解码器的并发错误检测的新颖方案

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This paper presents a concurrent error detection (CED) scheme for Orthogonal Latin Square (OLS) parallel decoders. Different from a CED scheme found in the technical literature that protects only the syndrome generator, the proposed CED scheme protects the whole OLS decoder for single stuck-at faults. This paper presents the detailed design and analysis of the proposed CED scheme and shows that it is strongly fault secure (SFS) for single stuck-at faults. Extensive simulation results are also provided; different figures of merit such as area, power dissipation, gate depth and coverage are assessed. It is shown that the proposed decoder designs for (n,k) t-bit error correcting OLS codes (k=16…256; t=2…5) have modest overheads. However, the most significant advantage of the proposed scheme is that it achieves 100 % fault coverage for the whole CED circuit, thus providing a very efficient and fully fault tolerant implementation.
机译:本文介绍了正交拉丁方(OLS)并行解码器的并发错误检测(CED)方案。不同于在技术文献中发现的CED方案,该方案仅保护综合征发生器,所提出的CED方案可以保护整个OLS解码器进行单一卡住故障。本文介绍了拟议的CED方案的详细设计和分析,并表明,对于单一卡住故障,它是强烈的故障安全(SFS)。还提供了广泛的仿真结果;评估面积,功耗,栅极深度和覆盖范围等优点的不同图。结果表明,所提出的解码器设计(n,k)t钻头误差校正OLS码(k = 16 ... 256; t = 2 ... 5)具有适度的开销。然而,所提出的方案的最显着优势在于它实现了整个CED电路100%的故障覆盖,从而提供了非常有效和完全容错的实现。

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