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A novel scheme for concurrent error detection of OLS parallel decoders

机译:OLS并行解码器并发错误检测的新方案

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This paper presents a concurrent error detection (CED) scheme for Orthogonal Latin Square (OLS) parallel decoders. Different from a CED scheme found in the technical literature that protects only the syndrome generator, the proposed CED scheme protects the whole OLS decoder for single stuck-at faults. This paper presents the detailed design and analysis of the proposed CED scheme and shows that it is strongly fault secure (SFS) for single stuck-at faults. Extensive simulation results are also provided; different figures of merit such as area, power dissipation, gate depth and coverage are assessed. It is shown that the proposed decoder designs for (n,k) t-bit error correcting OLS codes (k=16…256; t=2…5) have modest overheads. However, the most significant advantage of the proposed scheme is that it achieves 100 % fault coverage for the whole CED circuit, thus providing a very efficient and fully fault tolerant implementation.
机译:本文提出了一种用于正交拉丁方(OLS)并行解码器的并发错误检测(CED)方案。与仅保护校验子生成器的技术文献中的CED方案不同,所提出的CED方案可为整个OLS解码器保护单个卡死故障。本文介绍了所提出的CED方案的详细设计和分析,并表明它对于单个卡死故障具有很强的故障安全性(SFS)。还提供了广泛的仿真结果。评估了不同的品质因数,例如面积,功耗,栅极深度和覆盖范围。结果表明,所提出的用于(n,k)个t比特纠错OLS码(k = 16…256; t = 2…5)的解码器设计具有适度的开销。然而,所提出的方案的最显着优点是,对于整个CED电路,它实现了100%的故障覆盖率,因此提供了一种非常有效且完全容错的实施方案。

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