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Transient photoconductivity and photoexcited carrier dynamics in (Bi_(1-x)In_x)_2Se_3 thin films

机译:(Bi_(1-x)In_x)_2Se_3薄膜的瞬态光电导和光激发载流子动力学

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We use time-resolved THz spectroscopy to study microscopic conductivity and photoinduced carrier dynamics in MBE-grown 100 nm thick (Bi_(1-x)In_x)_2Se_3 thin films with indium concentration varying from x=0 to x=0.5. Both intrinsic and photoinduced conductivity in Bi2Se3 is significantly higher compared to the films with x=0.25 and x=0.50, with carriers that are not constrained by the twin domain boundaries and exhibit high mobility of 1100 cmVVs. We find that introducing indium with concentration of x=0.25 and higher, above the threshold for a topological to trivial transition, suppresses both intrinsic and photoinduced conductivity by over an order of magnitude and reduces the lifetime of photoexcited carriers. These findings demonstrate that controlling indium concentration in (Bi_(1-x)In_x)_2Se_3 films provides an avenue to design (Bi_(1-x)In_x)_2Se_3 films with desired properties for high-speed optoelectronic devices.
机译:我们使用时间分辨THz光谱研究了铟浓度从x = 0到x = 0.5的MBE生长的100 nm厚(Bi_(1-x)In_x)_2Se_3薄膜的微观电导率和光诱导的载流子动力学。与x = 0.25和x = 0.50的薄膜相比,Bi2Se3的固有和光诱导电导率都明显更高,其载流子不受孪晶畴边界的约束,并具有1100 cmVVs的高迁移率。我们发现,引入浓度为x = 0.25和更高的铟(高于从拓扑到琐碎过渡的阈值),可以抑制固有和光诱导的电导率超过一个数量级,并缩短了光激发载流子的寿命。这些发现表明,控制(Bi_(1-x)In_x)_2Se_3膜中的铟浓度为设计(Bi_(1-x)In_x)_2Se_3膜提供了一条途径,该膜具有高速光电器件所需的特性。

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