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Transient photoconductivity and photoexcited carrier dynamics in (Bi_(1-x)In_x)_2Se_3 thin films

机译:(Bi_(1-x)IN_X)瞬态光电导性和运动透射载波动力学_2se_3薄膜

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We use time-resolved THz spectroscopy to study microscopic conductivity and photoinduced carrier dynamics in MBE-grown 100 nm thick (Bi_(1-x)In_x)_2Se_3 thin films with indium concentration varying from x=0 to x=0.5. Both intrinsic and photoinduced conductivity in Bi2Se3 is significantly higher compared to the films with x=0.25 and x=0.50, with carriers that are not constrained by the twin domain boundaries and exhibit high mobility of 1100 cmVVs. We find that introducing indium with concentration of x=0.25 and higher, above the threshold for a topological to trivial transition, suppresses both intrinsic and photoinduced conductivity by over an order of magnitude and reduces the lifetime of photoexcited carriers. These findings demonstrate that controlling indium concentration in (Bi_(1-x)In_x)_2Se_3 films provides an avenue to design (Bi_(1-x)In_x)_2Se_3 films with desired properties for high-speed optoelectronic devices.
机译:我们使用时间分辨的ZHz光谱学研究MBE-生长100nm厚(Bi_(1-x)In_x)_2se_3薄膜中的微观电导率和光致载体动力学,其铟浓度从x = 0到x = 0.5变化。与X = 0.25和X = 0.50的膜相比,Bi2Se3中的固有和光诱导的电导率显着高得多,其具有不受双畴边界的载流子的载流子,并且表现出1100cmVV的高迁移率。我们发现,在拓扑到拓扑过渡的阈值之上,引入具有浓度x = 0.25且更高的铟,抑制了内在和光诱导的电导率,并通过了一定级别,并减少了光透镜载体的寿命。这些发现表明,控制铟浓度(Bi_(1-x)In_x)_2se_3薄膜提供了具有所需性能的设计(Bi_(1-x)In_x)_2se_3薄膜的途径,具有用于高速光电器件的所需特性。

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