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Sub-THz and THz Noise Generation by Diode Heterostructures under Impact Ionization

机译:碰撞电离下二极管异质结构产生亚太赫兹和太赫兹噪声

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Usage of subterahertz (sub-THz) and terahertz (THz) noise signals is widely applied to tomographic imaging, spectroscopy, calibration of radiometers, etc. The heterostructure diodes operation under impact ionization mode is considered as potential candidates to generation of noise oscillations on sub-THz and THz frequencies. Spectral analysis of time sequence of current, obtained by means of Monte Carlo simulations has been presented. Graded band gap heterostructures and heterojunction ones are taken into the account. The comparison of the noise properties of heterostructure diodes is carried out by determination of spectral noise power density.
机译:太赫兹(sub-THz)和太赫兹(THz)噪声信号的使用已广泛应用于断层成像,光谱学,辐射计的校准等。在碰撞电离模式下,异质结构二极管的工作被认为是潜在的候选对象,可在次生子上产生噪声振荡-THz和THz频率。提出了通过蒙特卡洛模拟获得的电流时间序列的频谱分析。考虑了梯度带隙异质结构和异质结结构。通过确定频谱噪声功率密度来进行异质结构二极管噪声特性的比较。

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