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100-V Class Two-step-oxide Field-Plate Trench MOSFET to Achieve Optimum RESURF Effect and Ultralow On-resistance

机译:100V两级氧化物级场板沟道MOSFET,可实现最佳RESURF效果和超低导通电阻

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We propose a 100-V class two-step-oxide Field-Plate MOSFET (2-step FP-MOSFET), which is formed by two steps of thick-oxide to simplify the structure and fabrication process. By optimizing design parameters, we reveal the 2-step FP-MOSFET can achieve sufficient RESURF (Reduced Surface Field) effect and an ultralow specific on-resistance ( RONA). Measurement results showed breakdown voltage of 109.9 V and the RONA of 27.7 mohm·mm2 with good process controllability. Moreover, as figure-of-merit of the 2-step FP-MOSFET, RON·Qg and RON·Qsw were reduced by 27.1% and 4.7%, respectively, compared with conventional one. Power loss estimation is also discussed by simple calculation.
机译:我们提出了一种100V类两步氧化物场板MOSFET(两步FP-MOSFET),它由两步厚的氧化物形成,以简化结构和制造工艺。通过优化设计参数,我们揭示了两步法FP-MOSFET可以实现足够的RESURF(减小的表面场)效应和超低的比导通电阻(RONA)。测量结果显示击穿电压为109.9 V,RONA为27.7 mohm·mm 2 具有良好的过程可控性。此外,作为两步法FP-MOSFET的品质因数,与传统方法相比,RON·Qg和RON·Qsw分别降低了27.1%和4.7%。功率损耗估计也可以通过简单的计算来讨论。

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