Destructive Single-Events and Latchup in Radiation-Hardened Switching Regulators

机译：辐射强化开关稳压器的破坏性单事件和闩锁

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摘要

Single-event destructive behavior and latchup has been observed in two separate radiation-hardened switching regulators. We discuss the test conditions and observed results.

机译：在两个单独的辐射硬化开关稳压器中已经观察到单事件破坏性行为和闩锁。我们讨论了测试条件和观察结果。

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《European Conference on Radiation and Its Effects on Components and Systems》|2017年|1-4|共4页
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Sergeh Vartanian; Gregory R. Allen; Farokh Irom; Leif Z. Scheick; Shirley Hart; Nick W. van Vonno; Larry Pearce;
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Ions; Temperature measurement; Testing; Measurement by laser beam; Regulators; Switches; Laser beams;

机译：离子;温度测量;测试;激光束测量;调节器;开关;激光束;

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Destructive Single-Events and Latchup in Radiation-Hardened Switching Regulators

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