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Vertical power diodes based on bulk GaN substrates

机译:基于块状GaN衬底的垂直功率二极管

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In this work, study on electrical properties of vertical GaN power diodes, including schottky barrier diodes (SBD) and p-n diodes, are presented. The devices with various drift layer thickness and net carrier electron concentration were simulated using the Silvaco ATLAS TCAD software packages. What's more, an optimum design of vertical GaN devices with drift layer thickness 10μm and net carrier doping concentration 1 × 1016cm3were fabricated. These devices, including Schottky barrier diodes with a breakdown voltage of 2250 V and specific on-resistance of 0.9 mΩ·cm-2, and p-n diode with a breakdown voltage of 2400 V and specific on-resistance of 0.85 mΩ·cm-2, exhibited excellent electric properties.
机译:在这项工作中,提出了对垂直GaN功率二极管(包括肖特基势垒二极管(SBD)和p-n二极管)的电性能的研究。使用Silvaco ATLAS TCAD软件包模拟了具有各种漂移层厚度和净载流子电子浓度的器件。此外,漂移层厚度为10μm,净载流子掺杂浓度为1×10的垂直GaN器件的最佳设计。 16 厘米 3 被捏造了。这些器件包括击穿电压为2250 V,比导通电阻为0.9mΩ·cm的肖特基势垒二极管 -2 和p-n二极管,其击穿电压为2400 V,比导通电阻为0.85mΩ·cm -2 ,表现出优异的电性能。

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