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High-Power GaN-Based Vertical Light-Emitting Diodes on 4-Inch Silicon Substrate

机译:4英寸硅衬底上的高功率基于GaN的垂直发光二极管

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摘要

We demonstrate high-power GaN-based vertical light-emitting diodes (LEDs) (VLEDs) on a 4-inch silicon substrate and flip-chip LEDs on a sapphire substrate. The GaN-based VLEDs were transferred onto the silicon substrate by using the Au–In eutectic bonding technique in combination with the laser lift-off (LLO) process. The silicon substrate with high thermal conductivity can provide a satisfactory path for heat dissipation of VLEDs. The nitrogen polar n-GaN surface was textured by KOH solution, which not only improved light extract efficiency (LEE) but also broke down Fabry–Pérot interference in VLEDs. As a result, a near Lambertian emission pattern was obtained in a VLED. To improve current spreading, the ring-shaped n-electrode was uniformly distributed over the entire VLED. Our combined numerical and experimental results revealed that the VLED exhibited superior heat dissipation and current spreading performance over a flip-chip LED (FCLED). As a result, under 350 mA injection current, the forward voltage of the VLED was 0.36 V lower than that of the FCLED, while the light output power (LOP) of the VLED was 3.7% higher than that of the FCLED. The LOP of the FCLED saturated at 1280 mA, but the light output saturation did not appear in the VLED.
机译:我们演示了在4英寸硅衬底上的高功率GaN基垂直发光二极管(LED)(VLED)和蓝宝石衬底上的倒装芯片LED。通过使用Au-In共晶键合技术与激光剥离(LLO)工艺相结合,将基于GaN的VLED转移到硅衬底上。具有高导热率的硅基板可以为VLED的散热提供令人满意的路径。氮极n-GaN表面通过KOH溶液进行纹理处理,不仅提高了光提取效率(LEE),而且还消除了VLED中的Fabry-Pérot干扰。结果,在VLED中获得了近朗伯发射模式。为了改善电流扩散,环形n电极均匀地分布在整个VLED上。我们的数值和实验结果相结合,显示出VLED具有优于倒装芯片LED(FCLED)的出色散热和电流扩散性能。结果,在350mA注入电流下,VLED的正向电压比FCLED低0.36V,而VLED的光输出功率(LOP)比FCLED高3.7%。 FCLED的LOP在1280 mA时饱和,但光输出饱和未出现在VLED中。

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