首页> 外文会议>International conference on advanced ceramics and composites >DOPING OF CeO_2 AS A TUNABLE BUFFER LAYER FOR COATED SUPERCONDUCTORS: A DFT STUDY OF MECHANICAL AND ELECTRONIC PROPERTIES
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DOPING OF CeO_2 AS A TUNABLE BUFFER LAYER FOR COATED SUPERCONDUCTORS: A DFT STUDY OF MECHANICAL AND ELECTRONIC PROPERTIES

机译:CeO_2作为涂层超导体可调节缓冲层的掺杂:机械和电子性能的DFT研究

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In layered ceramic superconductor architectures, CeO_2 buffer layers are known to form micro cracks during the fabrication process. To prevent this crack formation, doping of the CeO_2 layer has been suggested. In this theoretical study, the influence of dopants (both tetravalent and aliovalent) on the mechanical and structural properties of CeO_2 is investigated by means of density functional theory. Group Ⅳa and Ⅳb dopants show clearly distinct stability, with the former favouring interface and surface doping, while the latter favour uniform bulk doping. This behaviour is linked to the dopant electronic structure. The presence of charge compensating vacancies is shown to complicate the mechanical and structural picture for aliovalent dopants. We find that the vacancies often counteract the dopant modifications of the host material. In contrast, all dopants show an inverse relation between the bulk modulus and thermal expansion coefficient, independent of their valency and the presence of oxygen vacancies. Based on the study of these idealized systems, new dopants are suggested for applications.
机译:在层状陶瓷超导体结构中,已知CeO_2缓冲层会在制造过程中形成微裂纹。为了防止这种裂纹的形成,已经提出了对CeO_2层进行掺杂的建议。在该理论研究中,通过密度泛函理论研究了掺杂剂(四价和铝价)对CeO_2力学和结构性能的影响。 Ⅳa和Ⅳb族掺杂剂显示出明显不同的稳定性,前者有利于界面和表面掺杂,而后者有利于均匀的体掺杂。该行为与掺杂剂电子结构有关。已显示电荷补偿空位的存在使铝价掺杂剂的机械和结构图复杂化。我们发现空位通常抵消了主体材料的掺杂改性。相反,所有掺杂剂在其体积模量和热膨胀系数之间均呈反比关系,而与它们的化合价和氧空位的存在无关。基于对这些理想化系统的研究,建议使用新的掺杂剂。

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