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Reliability of gyroscopes based on piezoresistive nano-gauges against shock and free-drop tests

机译:基于压阻纳米规的陀螺仪对冲击和自由落体测试的可靠性

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Piezoresistive sensing through Si gauges of sub-micrometric cross-section represents an alternative to capacitive sensing in MEMS inertial sensors, potentially advantageous from a miniaturization point of view. Nevertheless, no reliability data against mechanical shocks and drops were presented for such type of technology so far. This work performs an experimental characterization campaign which includes shock tests up to 3400 g (gravity units) and free-drop tests in ceramic package, for 10 Z-axis plus 10 Y-axis gyroscopes based on nano-gauge readout. The results indicate 100% survivability rate to these experiments, verified through comparative modal analyses before and after the test. The results further demonstrate rate sensitivity changes after 10 free drops (onto marble surface) lower than 0.8%, a value within the characterization setup accuracy.
机译:通过亚微米横截面的Si量规的压阻式传感代表了MEMS惯性传感器中电容式传感的替代方案,从小型化的角度来看可能具有优势。但是,到目前为止,尚未提供针对此类技术的针对机械冲击和跌落的可靠性数据。这项工作进行了一项实验性表征活动,包括对高达3400 g(重力单位)的冲击测试和陶瓷封装中的自由落体测试,针对10根Z轴和10根Y轴陀螺仪,基于纳米规格的读数。结果表明对这些实验的100%生存率,在测试前后通过比较模态分析进行了验证。结果进一步表明,在10个自由滴(在大理石表面上)的自由滴度低于0.8%(表征设置精度范围内的一个值)后,速率敏感性变化。

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