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Optimization of the Ion Source Parameters to Change the Proportion of Single and Molecular Ions in Plasma

机译:离子源参数的优化改变等离子体中单分子离子的比例

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A high current Ion implanter “LUXiON” has a novel ion source which generates a “sheet beam” about 300mm high and produces ion species commonly used in silicon processing, such as boron, phosphorus, and arsenic. The source is designed to allow tuning of its source parameter to change the proportion of single and molecular ions in the plasma. By optimization of the ion source parameters, we could change the proportion of single and molecular ions. The ratio of molecular ions to single ions (BF2+/B+) was changed by operation conditions. The ratio in higher molecular ion mode is two times higher than single ion mode at low arc current condition, and over three times higher at high arc current conditon.
机译:高电流离子注入机“LUXiON”具有产生一“片材束”约高300mm,并且产生的离子种类在硅处理中通常使用的,诸如硼,磷,和砷的新颖离子源。源被设计为允许其源参数的调谐以改变单个和分子离子的等离子体中的比例。由离子源参数的优化,我们可以改变单和分子离子的比例。分子离子单离子之比(BF 2 + / B. + )通过操作条件而变化。在较高分子量的离子模式的比率为高两倍比在低的电弧电流条件单一离子模式,以及更高的三倍以上在高温电弧电流conditon。

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