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Reliability of Pb-free solder joints in FCBGA using finite element simulation and Taguchi method

机译:有限元模拟和Taguchi方法在FCBGA中无铅焊点的可靠性

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Thermo-mechanical reliability of containing Pb and Pb-free solder joints in FCBGA device subjected to an accelerated thermal cyclic loading was investigated based on finite element simulation and Taguchi method. Effects of different control factors on the reliability of the lead-free solder joints were anlyzed and calculated. The corner solder joint is the most critical solder joints in the ball array, the top surface of the solder joint is the crack propagated location. The optimal combination in FCBGA assembly show obvious enhancement effect on fatigue life of solder joints. Moreover, the solder material is the most important factor among the control factors in the FCBGA device.
机译:基于有限元模拟和Taguchi方法,研究了FCBGA器件中含有铅和无铅焊点在热循环载荷作用下的热机械可靠性。分析和计算了不同控制因素对无铅焊点可靠性的影响。角焊点是球形阵列中最关键的焊点,焊点的顶面是裂纹扩展的位置。 FCBGA组件中的最佳组合对焊点的疲劳寿命表现出明显的增强作用。此外,在FCBGA器件的控制因素中,焊接材料是最重要的因素。

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