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Time interleaved C-2C SAR ADC with background timing skew calibration in 65nm CMOS

机译:具有65nm CMOS的背景时序偏斜校准的时间交错C-2C SAR ADC

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This paper presents a 5GS/s 8-bit 40-way time-interleaved SAR ADC fabricated in 65nm CMOS. Two-level hierarchical interleaving is employed, resulting in 4 sub-ADCs each operating at 1.25GS/s at the topmost level with front-end track and hold samplers. The sub-ADCs use capacitive C-2C DACs to minimize the input capacitance and area. A novel background timing skew calibration method is used which requires no redundant signal paths. After calibration, the ADC achieves an SNDR of 33.3dB at Nyquist and consumes 138.6mW from a 1V supply with a 5GS/s sampling rate, yielding an FOM of 738fJ/conv-step. The individual sub-ADC achieves an SNDR of 37.9dB at Nyquist and consumes 34.2mW, yielding an FOM of 428fJ/conv-step.
机译:本文提出了一种采用65nm CMOS制成的5GS / s 8位40路时间交织SAR ADC。采用两级分层交织,产生了四个子ADC,每个子ADC在最顶层使用前端跟踪和保持采样器以1.25GS / s的速度运行。子ADC使用电容式C-2C DAC来最小化输入电容和面积。使用了一种新颖的背景定时偏斜校准方法,该方法不需要冗余信号路径。校准后,ADC在奈奎斯特(Nyquist)时的SNDR为33.3dB,并以5GS / s的采样率从1V电源消耗138.6mW功率,从而产生738fJ / conv步进的FOM。单个子ADC在Nyquist处的SNDR为37.9dB,功耗为34.2mW,FOM为428fJ / conv-step。

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