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Histogram-based qualification of data used in background or blind calibration of interleaving errors of time-interleaved ADCS

机译:用于时间交错ADCS的交错误差的背景或盲校正的基于直方图的数据鉴定

摘要

An ADC can include a plurality of time-interleaved ADCs to increase the overall sampling rate of the ADC. Such an ADC can have interleaving errors, since the time-interleaved ADCs in the ADC are not always perfectly matched. One way to calibrate for these mismatches is by observing the digital output signals of the time-interleaved ADCs in the background, or more broadly, without knowledge of the input signal to the ADC (often referred to as “blind” calibration). Due to the nature of these calibrations, the performance of the calibration would significantly degrade when the input signal has certain problematic input conditions, such as a certain coherent input frequency. To address this issue, the data being used for calibration of interleaving errors can go through a qualifying process to assess whether to update error estimates based on the data.
机译:ADC可以包括多个时间交错的ADC以增加ADC的整体采样率。这样的ADC可能会有交织错误,因为ADC中的时间交织ADC并非总是完美匹配。校准这些失配的一种方法是在不了解ADC的输入信号的情况下,在后台或更广泛地观察时间交错ADC的数字输出信号(通常称为“盲”校准)。由于这些校准的性质,当输入信号具有某些有问题的输入条件(例如某些相干的输入频率)时,校准的性能将大大降低。为了解决此问题,用于校准交织错误的数据可以经过合格过程,以评估是否根据该数据更新错误估计。

著录项

  • 公开/公告号US10536155B1

    专利类型

  • 公开/公告日2020-01-14

    原文格式PDF

  • 申请/专利权人 ANALOG DEVICES INC.;

    申请/专利号US201816138886

  • 发明设计人 ERIC OTTE;

    申请日2018-09-21

  • 分类号H03M1/06;H03M1/10;G06F11/07;

  • 国家 US

  • 入库时间 2022-08-21 11:28:28

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