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Experimental study of water absorption of electronic components and internal local temperature and humidity into electronic enclosure

机译:电子元件的吸水率和内部局部温度和湿度进入电子外壳的实验研究

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Corrosion reliability of electronic products is a key factor for electronics industry, and today there is a large demand for performance reliability in large spans of temperature and humidity during day and night shifts. Corrosion failures are still seen due to the effects of temperature, humidity and corrosion accelerating species in the atmosphere, and moreover the surface region of printed circuit board assemblies is often contaminated by various contaminating species. In order to evaluate the level of humidity at which failures such as electrochemical migration start to appear on printed circuit board assemblies, a study of combined electric field, hygroscopic contamination and humidity on inter-digitated test comb patterns contaminated with sodium chloride and further exposed to increasing humidity has been performed. Results showed a significant increase in leakage current when only 70-75 % RH was reached, corresponding to the deliquescence relative humidity level of NaCl. The overall effect of climate (humidity and temperature) has been studied on the internal climate of typical electronic enclosures. The varied parameters included material used for casing, s ize of opening, differential humidity, and temperature effects simulating dayight, and the use of desiccants.
机译:电子产品的耐腐蚀可靠性是电子行业的关键因素,如今,在白天和黑夜的大班温度和湿度范围内,对性能可靠性的需求很大。由于大气中的温度,湿度和腐蚀促进物质的影响,腐蚀失效仍然可见,而且印刷电路板组件的表面区域经常被各种污染物质污染。为了评估在印刷电路板组件上开始出现诸如电化学迁移等故障的湿度水平,对电场,吸湿性污染和湿度的组合电场进行了研究,这些梳状图案被氯化钠污染并进一步暴露于空气中。已经执行了增加湿度的操作。结果表明,当仅达到70-75%RH时,漏电流显着增加,这对应于NaCl潮解的相对湿度。已经研究了气候(湿度和温度)的总体影响对典型电子外壳的内部气候的影响。变化的参数包括用于外壳的材料,开孔尺寸,湿度差异和模拟昼/夜的温度影响以及使用干燥剂。

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