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Detection of single-charge polarisation in silicon double quantum dots by using serially-connected multiple single-electron transistors

机译:使用串联连接的多个单电子晶体管检测硅双量子点中的单电荷偏振

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We investigate novel serially-connected multiple single-electron transistors (MSETs) as a single-charge polarisation readout for silicon integrated charge qubits. We first design and analyse the double single-electron transistors (DSETs) in which double quantum dots are connected in series with two side gates. We show that the DSETs are sufficiently sensitive to distinguish all the single-charge polarisation states on the two charge qubits integrated adjacently. We also show the scalability of the MSETs by extending our analysis to a scaled-up system of serial triple single-electron transistors (TSETs) integrated with triple charge qubits. Finally we fabricate the DSETs with double charge qubits on the silicon-on-insulator substrate and observe hysteresis in the Coulomb oscillations of the tunnel current at temperature of 4.2 K, which are attributable to the change of polarisation in the double charge qubits.
机译:我们调查新颖的串联连接的多个单电子晶体管(MSET)作为用于硅集成电荷QUBITS的单电荷偏振读数。我们首先设计和分析双单电子晶体管(DSET),其中双量子点与两侧闸门串联连接。我们表明DSET足够敏感,以区分两个电荷Qubits在相邻的两个电荷Qubits上区分所有单电荷偏振状态。我们还通过将分析扩展到与三重电荷Qubits集成的串行三倍电子晶体管(TSET)的缩放系统进行分析来展示MSES的可扩展性。最后,我们在绝缘体上的硅上衬底上用双电荷Qubits制造DSET,并且在4.2k的温度下观察隧道电流的库仑振荡中的滞后,这可归因于双电荷Qubits中的极化的变化。

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