首页> 外文会议>International Conference on Simulation of Semiconductor Processes and Devices >An analytical model for predicting forming/switching time in conductive-bridge resistive random-access memory (CBRAM)
【24h】

An analytical model for predicting forming/switching time in conductive-bridge resistive random-access memory (CBRAM)

机译:用于预测导电桥电阻随机存取存储器中成形/切换时间的分析模型(CBRAM)

获取原文

摘要

Analytical solutions (i.e., compact model) to differential equations governing the surface movement of conductive filament (CF) in CBRAM have been developed. Time needed for forming and switching of memory cell can readily be evaluated based on the device structure and the applied bias. The accuracy of the model has been verified by comparison to both experimental and numerical simulation results for Ag-GeS2-W CBRAM cells.
机译:已经开发出CBRAM中导电丝(CF)表面运动的分析溶液(即紧凑型模型)。可以基于器件结构和施加的偏置来容易地评估形成和切换存储器单元所需的时间。通过与Ag-Ges2-W CBRAM细胞的实验性和数值模拟结果相比,已经验证了模型的准确性。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号