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An analytical model for predicting forming/switching time in conductive-bridge resistive random-access memory (CBRAM)

机译:用于预测导电桥电阻式随机存取存储器(CBRAM)中形成/转换时间的分析模型

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Analytical solutions (i.e., compact model) to differential equations governing the surface movement of conductive filament (CF) in CBRAM have been developed. Time needed for forming and switching of memory cell can readily be evaluated based on the device structure and the applied bias. The accuracy of the model has been verified by comparison to both experimental and numerical simulation results for Ag-GeS2-W CBRAM cells.
机译:已经开发出用于控制CBRAM中导电丝(CF)的表面运动的微分方程的解析解(即紧凑模型)。可以基于器件结构和施加的偏压容易地评估形成和切换存储单元所需的时间。通过与Ag-GeS2-W CBRAM单元的实验和数值模拟结果进行比较,验证了模型的准确性。

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