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Schottky barrier lowering effect in AlGaN/GaN heterostructure SBDs using nano-particles

机译:使用纳米粒子的AlGaN / GaN异质结构SBD中的肖特基势垒降低效应

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The correlations between the properties of an AlGaN/GaN device and the Schottky contact structure with and without nanoparticles (NPs) have been investigated. It has been found that the use of NPs effectively lowers the barrier height of the electrical contacts to AlGaN/GaN 2-DEG heterostructures. The Schottky barrier height of the Ni contact with embedded Au-NPs was significantly reduced by ~0.16 eV compared to the reference sample without NPs. The fabricated AlGaN/GaN SBDs with embedded Au-NPs show a turn-on voltage of ~1.7 V and an on-resistance of ~12.5 Ω·mm, respectively.
机译:研究了具有或不具有纳米颗粒(NP)的AlGaN / GaN器件的性能与肖特基接触结构之间的相关性。已经发现,使用NP有效地降低了电接触到AlGaN / GaN 2-DEG异质结构的势垒高度。与没有NP的参比样品相比,与嵌入的Au-NP的Ni接触的肖特基势垒高度显着降低了〜0.16 eV。带有嵌入式Au-NP的AlGaN / GaN SBD的开通电压分别为〜1.7 V和导通电阻为〜12.5Ω·mm。

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