首页> 外文会议>International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems >Geometric optimization of high performance interconnect of Rigid/Flexible/Rigid substrate for Wafer Level Packaging in Solid State Lighting applications by numerical simulations
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Geometric optimization of high performance interconnect of Rigid/Flexible/Rigid substrate for Wafer Level Packaging in Solid State Lighting applications by numerical simulations

机译:数值模拟晶圆水位晶圆水平封装高性能互连的几何优化

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Wafer Level Packaging (WLP) technology for Solid State Lighting application is regarded as great potential for cost reduction. Rigid/Flexible/Rigid (RFR) substrate that is capable of transforming WLP devices from 2-dimentional into 3-dimentional devices is of enormous interest in SSL industry. In this work, numerical simulations were performed to discover the optimized geometry of interconnects in the newly developed RFR substrate to meet the harsh requirements set for SSL products. The relations of maximum temperatures in the substrate as a function of interconnect geometry and bending angle at different current levels were derived. Moreover, by using the derived relations, geometric effects on electromigration behaviours of interconnect were investigated. Suggestions were given for optimizing the geometry of interconnects and avoiding over-bending of the substrate.
机译:用于固态照明应用的晶圆级包装(WLP)技术被认为是降低成本降低的巨大潜力。 能够将WLP器件转化为3层器件的WLP设备的刚性/柔性/刚性(RFR)衬底对SSL工业具有巨大兴趣。 在这项工作中,执行数值模拟,以发现新开发的RFR基底中的互连的优化几何形状,以满足SSL产品的苛刻要求。 推导了基板中的最大温度作为互连几何形状的函数和不同电流水平的弯曲角度的关系。 此外,通过使用衍生关系,研究了对互连电迁移行为的几何效应。 提供了优化互连的几何形状并避免衬底的过度弯曲的建议。

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