首页> 外文会议>International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems >Comparison of the thermal-mechanical behavior of a soldered stack influenced by the choice of the solder
【24h】

Comparison of the thermal-mechanical behavior of a soldered stack influenced by the choice of the solder

机译:由焊料选择的焊接堆的热电力行为的比较

获取原文

摘要

The following topics are dealt with: finite element analysis; solders; reliability; failure analysis; tin alloys; microsensors; electronics packaging; deformation; thermal expansion; printed circuits.
机译:处理以下主题:有限元分析;焊料;可靠性;故障分析;锡合金;微传感器;电子包装;形变;热膨胀;印刷电路。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号