POTENTIAL-INDUCED DEGRADATION – COMPARISON OF DIFFERENT TEST METHODS AND LOW IRRADIANCE PERFORMANCE MEASUREMENTS

摘要

Potential-induced degradation (PID) can cause high yield loss in PV systems. Both the industry and customershave therefore requested standardized test methods for evaluating the sensitivity of PV modules to PID effects. Based on theresults of a round-robin test with 3 module manufacturers and 4 test institutes, we developed a procedure for detecting PIDsensitivemodules with aluminium foil fully covering the glass and frame at 25°C. Working group IEC TC82 WG2 for thestandard IEC 62804 draft discusses an alternative test method involving a climatic chamber test at 60°C and 85% relativehumidity.The aim of this work is to compare the different test methods and to arrive at a standard test procedure for numerous moduletypes. Electroluminescence imaging at different module currents and low irradiance measurements provide early detectionand characterization of the PID effects on degraded modules from the field and in the laboratory.