Method and device for testing a solar module for potential-induced degradation susceptibility

摘要

The present invention relates to a method and an arrangement for testing a solar module in a permanently installed solar module assembly susceptible to potential-induced degradation. In the method, at least on a partial surface of the front cover of the solar module directly or via a network layer, an electrically conductive plate is placed and grounded, and applied one or more times a high voltage between the plate and one of the electrical terminals of the solar module. Between the two electrical terminals of the solar module, a parallel resistor and / or a current-voltage characteristic of the solar module is measured before the application of the high voltage and during or immediately after the application of the high voltage. By comparing the measured shunt resistances or current-voltage characteristics, it is then determined whether a potential-induced degradation of the solar module occurs. The proposed method and the associated arrangement enable testing of solar modules within a photovoltaic system in a simple manner and in a short period of time without having to remove it from the holder system.