Method for testing susceptibility to potential-induced degradation of components of solar modules, involves measuring potential-induced degradation of determined semiconductor body at end or after end of test period

摘要

The method involves applying and pressing a polymer film (16) on a semiconductor body (15) with a dielectric layer using a punch (7) with a metallic contact surface to form a stack of layers. The layer stack is brought to a test temperature and held for a test period at the test temperature. Electrical voltage is applied between the surface of the punch and a metal support (3) over the test period in a continuous or repeated manner. Potential-induced degradation of the determined semiconductor body with the dielectric layer is measured at the end or after the end of test period. An independent claim is also included for a device for testing susceptibility to potential-induced degradation of components of solar modules.