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Luminescent Properties of Ce Doped LuAG Thin Films Prepared by Pechini Sol-gel Method

机译:Pechini溶胶-凝胶法制备的Ce掺杂LuAG薄膜的发光特性

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Compared to phosphors, scintillating films are shown as a better feature for high-resolution display devices with low loss diffusion. Ce~(3+) doped lutetium aluminum garnet (LU_3Al_5O_(12), LuAG) scintillating films with different Ce~(3+) concentrations have been fabricated by Pechini sol-gel processing combined with the spin-coating technique and characterized by X-ray diffraction (XRD) and photoluminescence (PL) under excitation of UV-VIS light. The results of XRD patterns indicate that the specimen under study is a well-crystallized single-phase of cubic structure. Under an excitation of 442nm , it is found that the PL spectra is the typical Ce~(3+) emissions located in the 460-650 nm consisting of two emission bands due to the transitions from the lowest 5d excited state (2D) to the 4f ground state of Ce~(3+), which matches well with the sensitivity curve of the Si-photodiode . The luminescent intensity of LuAG: Ce~(3+) films varies with the Ce~(3+) contents and reaches the maximum at 1.0 mol% doped. With the increase of calcining temperature, the luminescence intensity in the PL spectra of LuAG:Ce~(3+) films is found to increased accordingly due to the improved crystallization.
机译:与磷光体相比,闪烁膜显示为具有低损耗扩散的高分辨率显示设备的更好的功能。通过Pechini溶胶-凝胶工艺结合旋涂技术制备了具有不同Ce〜(3+)浓度的Ce〜(3+)掺杂铝石榴石(LU_3Al_5O_(12),LuAG)闪烁膜。紫外-可见光激发下的射线衍射(XRD)和光致发光(PL)。 XRD图谱的结果表明,所研究的样品是结晶良好的单相立方结构。在442nm的激发下,由于最低5d激发态(2D)跃迁到Pd的跃迁,PL光谱是典型的Ce〜(3 +)发射峰,位于460-650 nm处,由两个发射带组成。 Ce〜(3+)的4f基态与Si光电二极管的灵敏度曲线非常吻合。 LuAG:Ce〜(3+)薄膜的发光强度随Ce〜(3+)含量的变化而变化,并在掺杂1.0 mol%时达到最大值。随着煅烧温度的升高,LuAG:Ce〜(3+)薄膜的PL光谱中的发光强度由于结晶度的提高而相应增加。

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