首页> 外文会议>European Photovoltaic Solar Energy Conference and Exhibition >THE EVOLUTION OF SLURRY GRIT PROPERTIES DURING MULTI WIRE WAFERING OF SILICON BRICKS
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THE EVOLUTION OF SLURRY GRIT PROPERTIES DURING MULTI WIRE WAFERING OF SILICON BRICKS

机译:硅砖多线晶片浆料砂砾特性的演变

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摘要

Using an industrial scale multi wire saw set up, the evolution of the slurry grit in the wafering process has been investigated. Two series of cuts have been performed with different slurry grits, each slurry batch being used for several consecutive cuts during which slurry samples have been extracted. The saw has been modified to allow for the in situ sampling of the slurry immediately in front of, and at the rear of, the brick that is being wafered. The slurry samples have been analysed for shape and size parameters, allowing conclusions to be drawn about the effect on the grit of a single pass through the sawing channel, as well as the overall evolution through the cuts.
机译:使用工业规模的多线锯设置,研究了晶片过程中的浆料砂砾的演变。已经用不同的浆料砂粒进行了两种切口,每个浆料批次用于几个连续切口,在此期间已经提取了浆料样品。锯已经被修改为允许在晶片的砖的前面和后部立即进行浆料的原位采样。已经分析了浆料样品的形状和尺寸参数,允许结论绘制通过锯切通道的单个通过的砂砾的影响,以及通过切割的整体进化。

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