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Cluster carbon implants — Cluster size and implant temperature effect

机译:团簇碳植入物—团簇尺寸和植入物温度影响

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In this paper we present results for amorphous layer thickness and interface roughness for various cluster carbon ions as well as monomer carbon implants for various doses implanted at different implant temperatures. The effect of cluster size, implant dose, implant dose rate and wafer implant temperatures are discussed based on Spectroscopic Ellipsometry, TEM and RBS/channeling techniques.
机译:在本文中,我们给出了各种簇碳离子以及在不同注入温度下注入各种剂量的单体碳注入的非晶层厚度和界面粗糙度的结果。基于光谱椭偏仪,TEM和RBS /通道技术讨论了簇尺寸,注入剂量,注入剂量率和晶片注入温度的影响。

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