【24h】

The Study of High Density PCB Reliability

机译:高密度PCB可靠性的研究

获取原文

摘要

The increase in board routing density, decrease the hole-to-hole spacing and lower to 0.30mm. High aspect ration PTH reliability is not the major issue since the plating copper has at least 20% elongation, but conductive anodic filaments (CAF) and laminate crack are to be concerned since the lead-free assembly and the application of fine pitch components. The lead-free assembly will require higher peak reflow temperature of up to 250degree, and the high temperature will cause thermal damage to PCB, on the other hand, the fine pitch component will require very close hole-to-hole spacing and hole-to-trace spacing, these factors will cause PCB to be easy damaged by the mechanical and thermal stress. The article introduces how to evaluate and avoid these risks.
机译:电路板路由密度的增加,降低孔到空穴间距,低至0.30mm。高宽高的比率Pth可靠性不是主要问题,因为电镀铜具有至少20%的伸长率,但是导电阳极长丝(CAF)和层压裂纹以来是由于无铅组装和微距组分的应用。无铅组件将需要更高的峰值回流温度高达250度,而且高温会对PCB导致热损坏,另一方面,细间距部件将需要非常接近的孔 - 孔间距和孔至孔隔离间距,这些因素将使PCB通过机械和热应力易于损坏。文章介绍了如何评估和避免这些风险。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号