首页> 外文会议>International conference on advanced ceramics and composites >THE EFFECTS OF EXCESS SILICON AND CARBON IN SiC SOURCE MATERIALS ON SiC SINGLE CRYSTAL GROWTH IN PHYSICAL VAPOUR TRANSPORT METHOD
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THE EFFECTS OF EXCESS SILICON AND CARBON IN SiC SOURCE MATERIALS ON SiC SINGLE CRYSTAL GROWTH IN PHYSICAL VAPOUR TRANSPORT METHOD

机译:超硅和碳对SiC源材料对物理蒸汽运输方法SiC单晶生长的影响

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Reaction processes occurring in physical vapour transport (PVT) method for silicon carbide (SiC) single crystals are described in the light of thermodynamics. A possible mechanism for SiC single crystal growth phenomena in PVT is reviewed briefly based upon the pressure-dependent Si-C equilibrium phase diagram we proposed, and the description is then applied to the case of surface graphitization of growing crystals, demonstrating that accurate thermodynamic understanding of the growth phenomena in PVT is quite important for the realization of larger diameter SiC single crystals with markedly reduced defect densities such as the micropipe defect or other various dislocations. Further, the effect of source mixture compositions on the thermal decomposition process of the mixtures is also discussed using the phase diagrams by examining the thermal decomposition processes of two exemplified cases of source powder mixtures with compositions of SiC(s)+C(s) and SiC(s)+Si(s) where SiC(s), C(s) and Si(s) represent solid SiC, solid graphite and solid silicon, respectively. It is suggested from the examination that, in the former SiC(s)+C(s) system, C(s) shows negligible evaporations unless the mutual mass exchange of carbon with the vapours is taken into account, whereas, for the latter SiC(s)+Si(s) system, an ordinary SiC single crystal growth can occur if such source mixtures are adopted in PVT growths, but it strongly depends on the whole composition of the source mixture as well as the temperature gradient between the seed and the source.
机译:根据热力学描述了用于碳化硅(SiC)单晶的物理蒸汽传输(PVT)方法的反应过程。基于我们提出的压力依赖性Si-C平衡相图,简要地审查PVT中的SiC单晶生长现象的可能机制,然后将描述应用于生长晶体的表面石墨化的情况,表明准确的热力学理解PVT中的生长现象对于实现较大直径的SiC单晶是非常重要的,其具有显着降低的缺陷密度,例如微皮缺损或其他各种脱位。此外,还使用了相图通过用碳化硅(S)+ C的(一个或多个)组合物检查的源粉末的混合物的2例示的情况下的热分解过程所讨论的混合物的热分解工艺源混合物的组合物的效果,并SiC(S)+ Si,其中SiC(S),C(S)和Si分别代表固体SiC,固体石墨和固体硅。它是从检查建议,在前者的SiC(s)+ C(S)系统,C(S)示出了可忽略的蒸发,除非与所述蒸气碳的相互质量交换是考虑到,而对于后者的SiC (S)+ Si(S)系统,如果在PVT生长中采用这种源混合物,则可能发生普通的SiC单晶生长,但它强烈取决于源混合物的整个组成以及种子和种子之间的温度梯度来源。

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