flip-chip devices; microassembling; life testing; integrated circuit reliability; remaining life assessment; failure analysis; reliability modelling; flip chip; board assemblies; correction function approach; analytical techniques; finite element techniques; reliability performance; electronic components; environmental tests; life tests; electronic packages; stress levels; failure mechanisms; failure rate; reliability testing; engineering alloys; fatigue strengths; endurance limits; life prediction; substrate metallization; underfill delamination; solder joint voids; underfill voids; intermetallic thickness; fatigue life; solder interconnects; stack analytical model; plastic strain; glass transition temperature; bond pad metallization;
机译:回流焊过程中的倒装板上芯片(FCOB)组件的有限元分析
机译:基于焊料疲劳的倒装芯片可靠性建模在叠层组件倒装芯片上的应用
机译:倒装焊锡凸块的热机械可靠性研究:使用激光超声技术和有限元方法
机译:倒装芯片上倒装芯片的建模可靠性实现校正功能方法的分析和有限元技术
机译:具有增强的*可靠性和有限元分析的双凸点倒装芯片工艺开发
机译:骨骼机械降解导向波评估的半分析有限元建模方法
机译:倒装芯片组装和底部填充应力;用aTC4.1装配测试芯片测量并用有限元法分析
机译:倒装芯片组装和底部填充应力;用aTC4.1装配测试芯片测量并用有限元法分析